Estimation of Leakage Power using Power Reduction Circuit

Research Area: Volume 3 Issue 2, March. 2014 Year: 2014
Type of Publication: Article Keywords: Leakage Power, Power Reduction Circuit, PMOS Transistor, NMOS Transistor
Authors:
  • Shailesh Kumar Mukati
  • Tarun Verma
  • Dr. Rita Jain
Journal: IJEIR Volume: 3
Number: 2 Pages: 185-189
Month: March
Abstract:
Scaling Associate in Nursingd power reduction trends in future technologies can cause subthreshold run currents to become an progressively massive part of total power dissipation. the big run power consumption is especially hard in mobile devices, wherever the battery charge capability poses a demanding limitation on the entire energy which will be consumed by a chip. during this technique, sleep transistor square measure placed between the circuits offer and provide rails to show off the run current flow throughout idle time this will be done by victimization one PMOS transistor and one NMOS transistor nonparallel with the transistors of every logic block to make a virtual ground and a virtual power supply. constant estimation victimization town simulation will acquire a comparatively correct estimation of the run distribution; but, this methodology needs an extended simulation time and is therefore computationally expensive. The static and dynamic power of a sleep stack is significantly low. however it's a delay penalty and its space demand is most compared with different processes. once the a sleep keeper method possesses wonderful speed criteria however it needs more static and dynamic power than a sleep stack. Our goal is to trade off between these limitations and therefore propose new ways that scale back each run and dynamic power with minimum attainable space and delay trade off.

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